Pata-Festplatten-E / A-Fehler in 2 Sektoren

Nachdem ich alle Partitionen gelöscht und eine Fat32-Partition erstellt hatte, habe ich diesen Fehler im Terminal erhalten und dann GSmartControl ausgeführt und einen Bericht erhalten. und auch der chkdsk gab mir einen fehler An error occurred while reading file allocation table (FAT 1).

Jetzt möchte ich wissen, ob die Festplatte reparierbar ist oder nicht?

blkid bericht bild

und der GSmartControl-Bericht:

smartctl 6.5 2016-05-07 r4318 [x86_64-linux-4.7.6-200.fc24.x86_64] (local build) Copyright (C) 2002-16, Bruce Allen, Christian Franke, www.smartmontools.org  === START OF INFORMATION SECTION === Model Family: Western Digital Caviar Device Model: WDC WD800BB-22JHC0 Serial Number: WD-WMAM9ACC8047 Firmware Version: 05.01C05 User Capacity: 80,025,280,000 bytes [80.0 GB] Sector Size: 512 bytes logical/physical Device is: In smartctl database [for details use: -P show] ATA Version is: ATA/ATAPI-6 (minor revision not indicated) Local Time is: Thu Dec 29 12:36:04 2016 EET SMART support is: Available - device has SMART capability. SMART support is: Enabled  === START OF READ SMART DATA SECTION === SMART overall-health self-assessment test result: FAILED! Drive failure expected in less than 24 hours. SAVE ALL DATA. See vendor-specific Attribute list for failed Attributes.  General SMART Values: Offline data collection status: (0x82) Offline data collection activity was completed without error. Auto Offline Data Collection: Enabled. Self-test execution status: ( 0) The previous self-test routine completed without error or no self-test has ever  been run. Total time to complete Offline  data collection: ( 2460) seconds. Offline data collection capabilities: (0x7b) SMART execute Offline immediate. Auto Offline data collection on/off support. Suspend Offline collection upon new command. Offline surface scan supported. Self-test supported. Conveyance Self-test supported. Selective Self-test supported. SMART capabilities: (0x0003) Saves SMART data before entering power-saving mode. Supports SMART auto save timer. Error logging capability: (0x01) Error logging supported. No General Purpose Logging support. Short self-test routine  recommended polling time: ( 2) minutes. Extended self-test routine recommended polling time: ( 35) minutes. Conveyance self-test routine recommended polling time: ( 5) minutes. SCT capabilities: (0x003f) SCT Status supported. SCT Error Recovery Control supported. SCT Feature Control supported. SCT Data Table supported.  SMART Attributes Data Structure revision number: 16 Vendor Specific SMART Attributes with Thresholds: ID# ATTRIBUTE_NAME FLAG VALUE WORST THRESH TYPE UPDATED WHEN_FAILED RAW_VALUE 1 Raw_Read_Error_Rate 0x000f 198 198 051 Pre-fail Always - 11183 3 Spin_Up_Time 0x0003 173 158 021 Pre-fail Always - 2333 4 Start_Stop_Count 0x0032 097 097 000 Old_age Always - 3233 5 Reallocated_Sector_Ct 0x0033 117 117 140 Pre-fail Always FAILING_NOW 661 7 Seek_Error_Rate 0x000f 172 098 051 Pre-fail Always - 3538 9 Power_On_Hours 0x0032 097 097 000 Old_age Always - 2381 10 Spin_Retry_Count 0x0013 100 100 051 Pre-fail Always - 0 11 Calibration_Retry_Count 0x0012 100 100 051 Old_age Always - 0 12 Power_Cycle_Count 0x0032 097 097 000 Old_age Always - 3096 194 Temperature_Celsius 0x0022 110 084 000 Old_age Always - 33 196 Reallocated_Event_Count 0x0032 001 001 000 Old_age Always - 1338 197 Current_Pending_Sector 0x0012 200 180 000 Old_age Always - 0 198 Offline_Uncorrectable 0x0010 181 181 000 Old_age Offline - 256 199 UDMA_CRC_Error_Count 0x003e 200 199 000 Old_age Always - 12 200 Multi_Zone_Error_Rate 0x0009 076 076 051 Pre-fail Offline - 3972  SMART Error Log Version: 1 ATA Error Count: 14426 (device log contains only the most recent five errors) CR = Command Register [HEX] FR = Features Register [HEX] SC = Sector Count Register [HEX] SN = Sector Number Register [HEX] CL = Cylinder Low Register [HEX] CH = Cylinder High Register [HEX] DH = Device/Head Register [HEX] DC = Device Command Register [HEX] ER = Error register [HEX] ST = Status register [HEX] Powered_Up_Time is measured from power on, and printed as DDd+hh:mm:SS.sss where DD=days, hh=hours, mm=minutes, SS=sec, and sss=millisec. It "wraps" after 49.710 days.  Error 14426 occurred at disk power-on lifetime: 2381 hours (99 days + 5 hours) When the command that caused the error occurred, the device was active or idle.  After command completion occurred, registers were: ER ST SC SN CL CH DH -- -- -- -- -- -- -- 40 51 01 10 03 00 e0 Error: UNC 1 sectors at LBA = 0x00000310 = 784  Commands leading to the command that caused the error were: CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name -- -- -- -- -- -- -- -- ---------------- -------------------- c8 00 01 10 03 00 00 58 00:24:23.460 READ DMA c8 00 01 10 03 00 00 58 00:24:21.480 READ DMA c8 00 01 10 03 00 00 58 00:24:19.365 READ DMA c8 00 01 10 03 00 00 58 00:24:17.095 READ DMA c8 00 01 10 03 00 00 58 00:24:14.980 READ DMA  Error 14425 occurred at disk power-on lifetime: 2381 hours (99 days + 5 hours) When the command that caused the error occurred, the device was active or idle.  After command completion occurred, registers were: ER ST SC SN CL CH DH -- -- -- -- -- -- -- 40 51 01 10 03 00 e0 Error: UNC 1 sectors at LBA = 0x00000310 = 784  Commands leading to the command that caused the error were: CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name -- -- -- -- -- -- -- -- ---------------- -------------------- c8 00 01 10 03 00 00 58 00:24:21.480 READ DMA c8 00 01 10 03 00 00 58 00:24:19.365 READ DMA c8 00 01 10 03 00 00 58 00:24:17.095 READ DMA c8 00 01 10 03 00 00 58 00:24:14.980 READ DMA c8 00 01 10 03 00 00 58 00:24:13.015 READ DMA  Error 14424 occurred at disk power-on lifetime: 2381 hours (99 days + 5 hours) When the command that caused the error occurred, the device was active or idle.  After command completion occurred, registers were: ER ST SC SN CL CH DH -- -- -- -- -- -- -- 40 51 01 10 03 00 e0 Error: UNC 1 sectors at LBA = 0x00000310 = 784  Commands leading to the command that caused the error were: CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name -- -- -- -- -- -- -- -- ---------------- -------------------- c8 00 01 10 03 00 00 58 00:24:19.365 READ DMA c8 00 01 10 03 00 00 58 00:24:17.095 READ DMA c8 00 01 10 03 00 00 58 00:24:14.980 READ DMA c8 00 01 10 03 00 00 58 00:24:13.015 READ DMA c8 00 07 09 03 00 00 58 00:24:13.015 READ DMA  Error 14423 occurred at disk power-on lifetime: 2381 hours (99 days + 5 hours) When the command that caused the error occurred, the device was active or idle.  After command completion occurred, registers were: ER ST SC SN CL CH DH -- -- -- -- -- -- -- 40 51 01 10 03 00 e0 Error: UNC 1 sectors at LBA = 0x00000310 = 784  Commands leading to the command that caused the error were: CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name -- -- -- -- -- -- -- -- ---------------- -------------------- c8 00 01 10 03 00 00 58 00:24:17.095 READ DMA c8 00 01 10 03 00 00 58 00:24:14.980 READ DMA c8 00 01 10 03 00 00 58 00:24:13.015 READ DMA c8 00 07 09 03 00 00 58 00:24:13.015 READ DMA c8 00 01 08 03 00 00 58 00:24:13.015 READ DMA  Error 14422 occurred at disk power-on lifetime: 2381 hours (99 days + 5 hours) When the command that caused the error occurred, the device was active or idle.  After command completion occurred, registers were: ER ST SC SN CL CH DH -- -- -- -- -- -- -- 40 51 01 10 03 00 e0 Error: UNC 1 sectors at LBA = 0x00000310 = 784  Commands leading to the command that caused the error were: CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name -- -- -- -- -- -- -- -- ---------------- -------------------- c8 00 01 10 03 00 00 58 00:24:14.980 READ DMA c8 00 01 10 03 00 00 58 00:24:13.015 READ DMA c8 00 07 09 03 00 00 58 00:24:13.015 READ DMA c8 00 01 08 03 00 00 58 00:24:13.015 READ DMA ec 00 01 00 00 00 00 58 00:24:13.015 IDENTIFY DEVICE  SMART Self-test log structure revision number 1 No self-tests have been logged. [To run self-tests, use: smartctl -t]  SMART Selective self-test log data structure revision number 1 SPAN MIN_LBA MAX_LBA CURRENT_TEST_STATUS 1 0 0 Not_testing 2 0 0 Not_testing 3 0 0 Not_testing 4 0 0 Not_testing 5 0 0 Not_testing Selective self-test flags (0x0): After scanning selected spans, do NOT read-scan remainder of disk. If Selective self-test is pending on power-up, resume after 0 minute delay.